GENLAUE - Parameter Refinement & Spot Prediction
Abstract
The program GENLAUE is used to refine the crystal orientation by matching
observed and predicted spot positions on a Laue pattern. The program is
run interactively on a terminal which has ANSI and T4010 graphics
support. Where required, Laue diffraction images are displayed as
threshold plots on the graphics screen. Where the match between the
predicted and observed spot positions is not close, the cursor is
used to input, manually, observed and predicted spot positions to be
used in the orientation refinement. When the match is sufficiently
good, the program can automatically search for the observed spot positions
close to the predicted spot positions for a set of non-spatially overlapped
nodal spots and use these determined positions for further refinement.
The process is iterated until a satisfactory refinement is achieved
and a list of predicted spots is written out to a pair of files,
the so called .ge1 and .ge2 files, for use by subsequent programs such
as the integrated intensity determination program INTLAUE.
Documentation
A user documentation file
is available in html format. The suite is distributed with a plain
text file equivalent.
Availability
The program is distributed as part of the
Laue Software Suite.
Contact
Quan Hao <:qhao@dmu.ac.uk>
John W. Campbell
CCLRC Daresbury Laboratory
Last update 21 August 1996